6 results
Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO2
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2540-2541
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- August 2019
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The Tomographic Atom Probe: Salient Results and Recent Breakthroughs
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 96-97
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- August 2005
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Atomic Level Characterization of Neutron Irradiated Pressure Vessel Steels
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- Journal:
- MRS Online Proceedings Library Archive / Volume 650 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, R6.1
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- 2000
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Effect of Annealing and Re-irradiation on the Copper-enriched Precipitates in a Neutron-irradiated Pressure Vessel Steel Weld
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- Journal:
- MRS Online Proceedings Library Archive / Volume 650 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, R3.15
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- 2000
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Tomographic Atom Probe: New Dimension in Materials Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue 1 / January 1999
- Published online by Cambridge University Press:
- 31 July 2002, pp. 39-47
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- January 1999
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The Tomographic Atom Probe: A New Dimension In Material Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 78-79
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- July 1998
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